{"product_id":"micron-technology-dram-sdram-ddr4-part-mt40a2g4sa-062e-j-dynamic-random-access-memory-dex","title":"Micron Technology DRAM SDRAM, Part #: MT40A2G4SA-062E:J | Dynamic random access memory | DEX","description":"\u003cp\u003eMicron Technology DRAM SDRAM-DDR4, Part #: MT40A2G4SA-062E:J features: • VDD = VDDQ = 1.2V ±60mV • VPP = 2.5V –125mV\/+250mV • On-die, internal, adjustable VREFDQ generation • 1.2V pseudo open-drain I\/O • Refresh maximum interval time at TC temperature range: – 64ms at –40°C to 85°C – 32ms at 85°C to 95°C – 16ms at 96°C to 105°C – 8ms at 106°C to 125°C • 16 internal banks ( x8): 4 groups of 4 banks each • 8 internal banks (x16): 2 groups of 4 banks each • 8n-bit prefetch architecture • Programmable data strobe preambles • Data strobe preamble training • Command\/Address latency (CAL) • Multipurpose register read and write capability • Write leveling • Self refresh mode • Low-power auto self refresh (LPASR) • Temperature controlled refresh (TCR) • Fine granularity refresh • Self refresh abort • Maximum power saving • Output driver calibration • Nominal, park, and dynamic on-die termination (ODT) • Data bus inversion (DBI) for data bus • Command\/Address (CA) parity • Databus write cyclic redundancy check (CRC) • Per-DRAM addressability • Connectivity test • Hard post package repair (hPPR) and soft post package repair (sPPR) modes • JEDEC JESD-79-4 compliant\u003c\/p\u003e\n\u003cp\u003e \u003c\/p\u003e\n\u003cp\u003eMIL:MT40A2G4SA-062E J\u003c\/p\u003e\n\u003cp\u003eMT40A2G4SA-062E:J\u003c\/p\u003e","brand":"Micron Technology","offers":[{"title":"Default Title","offer_id":43011704815815,"sku":"MIL:MT40A2G4SA-062E J","price":14.18,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0480\/2750\/0701\/products\/micron-technology-dram-sdram-part-mt40a2g4sa-062ej-dynamic-random-access-memory-dex-information-technology-micron-technology-316173.jpg?v=1674084463","url":"https:\/\/edexdealstest.myshopify.com\/products\/micron-technology-dram-sdram-ddr4-part-mt40a2g4sa-062e-j-dynamic-random-access-memory-dex","provider":"DEX TEST","version":"1.0","type":"link"}