{"product_id":"micron-technology-dram-part-mt61k512m32kpa-16-c-dynamic-random-access-memory-dex","title":"Micron Technology DRAM SDRAM-DDR4, Part #: MT61K512M32KPA-16:C | Dynamic random access memory | DEX","description":"\u003cp\u003eMicron Technology DRAM , Part #: MT61K512M32KPA-16:C features: • VDD = VDDQ = 1.35V ±3% and 1.25V ±3% • VPP = 1.8V –3%\/+6% • Data rate: 14 Gb\/s, 16 Gb\/s • 2 separate independent channels (x16) • x16\/x8 and 2-channel\/pseudo channel (PC) mode configurations set at reset • Single ended interfaces per channel for command\/ address (CA) and data • Differential clock input CK_t\/CK_c for CA per 2 channels • Two differential clock inputs WCK_t\/WCK_c per channel for data (DQ, DBI_n, EDC) • Double data rate (DDR) command\/address (CK) • Quad data rate (QDR) and double data rate (DDR) data (WCK), depending on operating frequency • 16n prefetch architecture with 256 bits per array read or write access • 16 internal banks • 4 bank groups for tCCDL = 3tCK and 4tCK • Programmable READ latency • Programmable WRITE latency • Write data mask function via CA bus with single and double byte mask granularity • Data bus inversion (DBI) and CA bus inversion (CABI) • Input\/output PLL • CA bus training: CA input monitoring via DQ\/ DBI_n\/EDC signals • WCK2CK clock training with phase information via EDC signals • Data read and write training via read FIFO (depth = 6) • Read\/write data transmission integrity secured by cyclic redundancy check • Programmable CRC READ latency • Programmable CRC WRITE latency • Programmable EDC hold pattern for CDR • RDQS mode on EDC pins • Low power modes • On‐chip temperature sensor with read‐out • Auto precharge option for each burst access • Auto refresh mode (32ms, 16k cycles) with per-bank and per-2-bank refresh options • Temperature sensor controlled self refresh rate • Digital tRAS lockout • On‐die termination (ODT) for all high‐speed inputs • Pseudo open drain (POD135 and POD125) compatible outputs • ODT and output driver strength auto calibration with external resistor ZQ pin (120Ω) • Internal VREF with DFE for data inputs, with input receiver characteristics programmable per pin • Selectable external or internal VREF for CA inputs; programmable VREF offsets for internal VREF • Vendor ID for device identification • IEEE 1149.1 compliant boundary scan • 180-ball BGA package • Lead-free (RoHS-compliant) and halogen-free packaging • TC = 0°C to +95°C\u003c\/p\u003e\n\u003cp\u003e \u003c\/p\u003e\n\u003cp\u003eMIL:MT61K512M32KPA-16 C\u003c\/p\u003e\n\u003cp\u003eMT61K512M32KPA-16:C\u003c\/p\u003e","brand":"Micron Technology","offers":[{"title":"Default Title","offer_id":43011691905223,"sku":"MIL:MT61K512M32KPA-16 C","price":42.12,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0480\/2750\/0701\/products\/micron-technology-dram-sdram-ddr4-part-mt40a512m8sa-075f-tr-dynamic-random-access-memory-dex-information-technology-micron-technology-583987.jpg?v=1674083910","url":"https:\/\/edexdealstest.myshopify.com\/en-amer\/products\/micron-technology-dram-part-mt61k512m32kpa-16-c-dynamic-random-access-memory-dex","provider":"DEX TEST","version":"1.0","type":"link"}